Future Mobility

Researchers Control 2D Semiconductor Growth for Future Chips

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2D semiconductor growth control technique

Breakthrough Enables Precise 2D Semiconductor Growth at Scale Researchers have achieved precise control over 2D semiconductor growth using a novel etching flux technique, potentially solving a major manufacturing hurdle for next-generation chips. However, the breakthrough comes from a team at KAIST and South Korean startup TDS Innovation, whose work appeared in Nature on October 7. … Read more

First-ever Recorded X-ray Signature of a Single Atom.

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X-ray signature of a single atom

For the first time, scientists have measured the X-ray signature of a single atom. A multi-center team with contributors from Ohio University, Argonne National Laboratory, the University of Illinois-Chicago, and others published the work in Nature. This study could have enormous implications for scientists’ capability to detect chemical elements in materials. Trapped at attogram X-rays … Read more